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          IN CIRCUIT and functional tester

          • 產品名稱:IN CIRCUIT and functional tester
          • 產品型號:Compact SL
          • 產品廠商:seica
          • 產品文檔:
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          簡單介紹
          This configuration offers a completely automated solution via an integrated, SMEMA-compatible conveyor system, allowing completely automatic board handling and easy integration into high volume production lines. Configurable as ICT,

          IN CIRCUIT and functional tester

          的詳細介紹

          This configuration offers a completely automated solution via an integrated, SMEMA-compatible conveyor system,  allowing completely automatic board handling and easy integration into high volume production lines. Configurable as ict, pre-functional, functional and combinational. The compact footprint and the compliance with WCM criteria, enable easy and successful integration both in-line and/or within an automated test  island. Cost reduction and high throughput guaranteed.

          Compact SL is particularly suitable for:

          • parametric and in-circuit tests
          • functional tests
          • On-board programming
          • In-line integration
          • High-volume production
          • Automated test islands
          • Operator-free use
          • Handling costs reduction


          Features

          • Up to 1536 analog channels
          • Up to 128 hybrid channels (digital channel up to 10 MHz)
          • Reaching Up to 6 user power supply units
          • 2-JOB paralllel test with standard cabinet
          • 4-JOB parallel test with double cabinet
          • OPENFIX for open pin identification on digital components and connectors
          • Universal on-board programmer (up to 8 in parallel)
          • Boundary-scan test
          • Self-test at the module level
          • Receiver with pneumatic press and upper contrasts
          • Off-line Programming and Repair Stations
          • barcode and 2D code reading management; automatic statistic data collection
          • Automated programming via CAD data import



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