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          Medalist i1000D

          • 產品名稱:Medalist i1000D
          • 產品型號:i1000D ict
          • 產品廠商:其它品牌
          • 產品文檔:
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          簡單介紹
          The Agilent Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards

          Medalist i1000D

          的詳細介紹

          The Agilent i1000D is now even better. Improving from its previous state of an analog-only ict, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless./Medalist  i1000D

          With its new digital capabilities, the i1000D now can perform digital PCF/VCL library based testing, Boundary Scan and I2C/SPI serial programming on a simple, low-cost long-wired test fixture. This presents an excellent opportunity for customers who are looking for better test coverage without any increase in cost./Medalist  i1000D
          The i1000D retains all the cutting-edge innovations of the earlier models, such as Agilent VTEP v2.0 Powered vectorless test suite, comprising the award-winning iVTEP and Network Parameter Measurement, while adding the latest Cover-Extend Technology to its arsenal
          Ease of us                                                      

          ystem Highlights
           
           
           
          Digital test are usually viewed as
          complex, difficult to understand
          and debug by many users. With the
          i1000D, things are different. The
          digital debug GUI leverages the
          control and flexibility of the legendary
          i3070 PushButton debug GUI,
          allowing engineers and technicians
          to have full control of the digital test

           
           
           
           
           
          parameters and test source codes,
          yet making it easy to understand. This
          is achieved by transforming lines of
          the complicated digital test source
          codes into simple, easy to understand
          graphical waveforms. Engineers and
          technicians performing debug are
          shielded from the massive lines
          of codes.

           

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